| Name | Type | Details |
| Testing Written Very Small | Article |
Description: Evaluation Engineering Magazine article discusses techniques used to test MEMS devices.
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Author(s): Lecklider, Tom License: Commercial Format: PDF Price: Free URL: http://www.evaluationengineering.com/ archive/ articles/ 0906/ 0906testing_written.asp ReviewText: 7 page article discusses techniques and equipment used to verify MEMS structures and operation. We especially like the tutorial on confocal microscopy. Keywords: MEMS , profilometry , Laser-Doppler vibrometry , confocal scanning microscopy , interferometry , interference fringe counting , wafer level test , scanning microscopy Submitter: EE HomePage Editorial Staff Affiliation: None xml_ID: 1174239222 (single entry page) |
| Photonics Spectra | Magazine/Journal |
Description: Photonics Spectra magazine is published monthly by Laurin Publishing Co., Inc. and offers worldwide coverage of optics, lasers, imaging, fiber optics, electro-optics and photonic component manufacturing.
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Author(s): Various License: Commercial Format: Paper, HTML Price: Free URL: http://www.photonics.com/ ReviewText: The photonics.com website has a nice resources page at http://www.photonics.com/handbookHome.aspx. Keywords: optics , lasers , photonics , LEDs , interferometry , fiber optics , display technology , microscopy , cameras , colorimetry Submitter: EE HomePage Editorial Staff Affiliation: None xml_ID: 1185848868 (single entry page) |
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