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"statistical process control" references for the Electrical Engineer
Entries 1 through 1 of 1 were returned.
|Overcoming the Measurement Challenges of Advanced Semiconductor Technologies: DC, Pulse, and RF - From Modeling to Manufacturing
Description: This 1st Edition text from Keithley discusses topics relating to advanced transistor gates and thin oxides, RF modeling, process control, and reliability testing.
URL: http://www.keithley.com/ wb/ 201
We couldn't find an online copy, but Keithly will send you a free bound copy simply by filling out the form at the link we've supplied. We got our copy a few weeks after registering.
- Integrating high frequency capacitance measurements for monitoring process variation
- Qualifying high K gate materials with charge-trapping measurements
- How to get accurate trap density measurements using charge pumping
- RF wafer testing
- Statistical process control of wireless device manufacturing
- Wafer reliability testing
- Femtoamp DC Leakage for Mobile ICs
, lab measurements
, reliability testing
, thermal stability
, statistical process control
Submitter: EE HomePage Editorial Staff
1188483176 (single entry page
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